JPH02124504U - - Google Patents
Info
- Publication number
- JPH02124504U JPH02124504U JP3339389U JP3339389U JPH02124504U JP H02124504 U JPH02124504 U JP H02124504U JP 3339389 U JP3339389 U JP 3339389U JP 3339389 U JP3339389 U JP 3339389U JP H02124504 U JPH02124504 U JP H02124504U
- Authority
- JP
- Japan
- Prior art keywords
- images
- image recognition
- resin
- appearance inspection
- inspection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011800 void material Substances 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3339389U JPH02124504U (en]) | 1989-03-25 | 1989-03-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3339389U JPH02124504U (en]) | 1989-03-25 | 1989-03-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02124504U true JPH02124504U (en]) | 1990-10-15 |
Family
ID=31537010
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3339389U Pending JPH02124504U (en]) | 1989-03-25 | 1989-03-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02124504U (en]) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014010138A (ja) * | 2012-07-03 | 2014-01-20 | Ricoh Elemex Corp | 検査装置および検査方法 |
| WO2018088552A1 (ja) * | 2016-11-14 | 2018-05-17 | 日本碍子株式会社 | セラミックス体の欠陥検査装置および欠陥検査方法 |
-
1989
- 1989-03-25 JP JP3339389U patent/JPH02124504U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014010138A (ja) * | 2012-07-03 | 2014-01-20 | Ricoh Elemex Corp | 検査装置および検査方法 |
| WO2018088552A1 (ja) * | 2016-11-14 | 2018-05-17 | 日本碍子株式会社 | セラミックス体の欠陥検査装置および欠陥検査方法 |
| JPWO2018088552A1 (ja) * | 2016-11-14 | 2018-11-15 | 日本碍子株式会社 | セラミックス体の欠陥検査装置および欠陥検査方法 |
| US11226295B2 (en) | 2016-11-14 | 2022-01-18 | Ngk Insulators, Ltd. | Ceramic body defect inspecting apparatus and defect inspecting method |